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CAS RN: 4946-22-9 | Product Number: D4047
4-(Dimethylamino)benzenethiol
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Purity: >98.0%(GC)(T)
Synonyms:
- 4-(Dimethylamino)thiophenol
- 4-Mercapto-N,N-dimethylaniline
Product Documents:
| Size | Unit Price | Belgium | Japan* | Quantity |
|---|---|---|---|---|
| 1G |
£70.00
|
20 | ≥100 |
|
*Stock available in Belgium will be delivered in 1 to 3 days
*Stock available in Japan will be delivered in 1 to 2 weeks (excludes regulated items and dry ice shipments).
| Product Number | D4047 |
| Purity / Analysis Method | >98.0%(GC)(T) |
| Molecular Formula / Molecular Weight | C__8H__1__1NS = 153.24 |
| Physical State (20 deg.C) | Solid |
| Storage Temperature | Refrigerated (0-10°C) |
| Store Under Inert Gas | Store under inert gas |
| Condition to Avoid | Air Sensitive |
| CAS RN | 4946-22-9 |
| Reaxys Registry Number | 1635423 |
| PubChem Substance ID | 125307771 |
| MDL Number | MFCD01658123 |
Specifications
| Appearance | White or Colorless to Yellow to Orange powder to lump to clear liquid |
| Purity(GC) | min. 98.0 % |
| Purity(Nonaqueous Titration) | min. 98.0 % |
Properties (reference)
| Melting Point | 33 °C |
| Boiling Point | 260 °C |
GHS
| Pictogram |
|
| Signal Word | Warning |
| Hazard Statements | H302 : Harmful if swallowed. H315 : Causes skin irritation. H319 : Causes serious eye irritation. |
| Precautionary Statements | P501 : Dispose of contents/ container to an approved waste disposal plant. P270 : Do not eat, drink or smoke when using this product. P264 : Wash skin thoroughly after handling. P280 : Wear protective gloves/ eye protection/ face protection. P337 + P313 : If eye irritation persists: Get medical advice/ attention. P301 + P312 + P330 : IF SWALLOWED: Call a POISON CENTER/doctor if you feel unwell. Rinse mouth. |
Related Laws:
| RTECS# | DC1575000 |
Transport Information:
| HS Number | 2930909599 |
Application
Improvement of Organic Thin-film Transistors by Adopting the Self-assembled Monolayer of Thiol Compound
References
- M. Kitamura, Y. Kuzumoto, S. Aomori, M. Kamura, J. H. Na, Y. Arakawa, Appl. Phys. Lett. 2009, 94, 083310.
- M. Kitamura, Y. Arakawa, Jpn. J. Appl. Phys. 2011, 50, 01BC01.
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